| Module code | EFR 716 |
| Qualification | Postgraduate |
| Faculty | Faculty of Engineering, Built Environment and Information Technology |
| Module content | Credits: 16 (must be combined with Introduction to the science of measurement to form a 32 credit module) Theory: Michelson interferometer, Mach-Zehnder interferometer, Shack-Hartmann interferometer, Fabry-Perot interferometer, introduction to polarisation interferometry, introduction to interference microscopy, introduction to optical thin films. Practical: alignment of optical flats, evaluation of optical surfaces, interpretation of interferograms obtained from a Fisba interferometer, interpretation of Newton fringes, application of a wedge interferometer to determine the thickness of a thin film. |
| Module credits | 16.00 |
| Programmes |
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| Prerequisites | No prerequisites. |
| Contact time | 16 contact hours per semester |
| Language of tuition | English |
| Academic organisation | Electrical, Electronic and Com |
| Period of presentation | Semester 1 |
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